Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

These two common macros will be no longer present everywhere.
Call out the include needs of them explicitly where required.
Signed-off-by: NPaul Gortmaker <paul.gortmaker@windriver.com>

A portion of the `check_pattern()' function is basically a `memcmp()'.
Since it's possible for `memcmp()' to be optimized for a particular
architecture, we should use it instead.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Updates to our default function for creating bad block patterns have
broken the "no OOB" feature. The NAND_BBT_NO_OOB option should not be
set while scanning for bad blocks, but we've been passing all BBT
options from nand_chip.bbt_options to the bad block scan. This causes us
to hit the:

	BUG_ON(bd->options & NAND_BBT_NO_OOB);

in create_bbt() when we scan the flash for bad blocks.

Thus, while it can be legal to set NAND_BBT_NO_OOB in a custom badblock
pattern descriptor (presumably with NAND_BBT_CREATE disabled?), we
should not pass it through in our default function.

Also, to help clarify and emphasize that the function creates bad block
patterns only (not, for example, table descriptors for locating
flash-based BBT), I renamed `nand_create_default_bbt_descr' to
`nand_create_badblock_pattern'.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Because there are so many cases of checking, writing, and re-writing of
the bad block table(s), we might as well wait until the we've settled on
a valid, clean copy of the table. This also prevents us from falsely
incrementing the table version. For example, we may have the following:

  Primary table, with version 0x02
  Mirror table, with version 0x01
  Primary table has uncorrectable ECC errors

If we don't have this fix applied, then we will:

  Choose to read the primary table (higher version)
  Set mirror table version to 0x02
  Read back primary table
  Invalidate table because of ECC errors
  Retry readback operation with mirror table, now version 0x02
  Mirrored table reads cleanly
  Writeback BBT to primary table location (with "version 0x02")

However, the mirrored table shouldn't have a new version number.
Instead, we actually want:

  Choose to read the primary table (higher version)
  Read back primary table
  Invalidate table because of ECC errors
  Retry readback with mirror table (version 0x01)
  Mirrored table reads cleanly
  Set both tables to version 0x01
  Writeback BBT to primary table location (version 0x01)
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Now that `read_bbt()' returns ECC error codes properly, we handle those
codes when checking the integrity of our flash-based BBT.

The modifications can be described by this new policy:

*) On any uncorrected ECC error, we invalidate the corresponding table
   and retry our version-checking integrity logic.
*) On corrected bitflips, we mark both tables for re-writing to flash
   (a.k.a. scrubbing).

Current integrity checks (i.e., comparing version numbers, etc.) should
take care of all the cases that result in rescanning the device for bad
blocks or falling back to the BBT as found in the mirror descriptor.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Instead of just printing a warning when encountering ECC errors, we
should return a proper error status and print a more informative
warning. Later, we will handle these error messages in the upper layers
of the BBT scan.

Note that this patch makes our check for ECC error codes a little bit
more restrictive, leaving all unrecognized errors to the generic "else"
clause. This shouldn't cause problems and could even be a benefit.

This code is based on some findings reported by Matthieu Castet.
Reported-by: NMatthieu CASTET <matthieu.castet@parrot.com>
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

This is a second step in restructuring `check_create()'. When we don't
rely on goto statements for our main functionality, the code will become
a little easier to manipulate.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

We will begin restructuring the code for check_create so that we can
make some important changes. For now, we should just begin to get rid of
some goto statements to make things cleaner. This is the first step of a
few, which are separated to make them easier to follow.

This step should just be a code refactor.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Remove some extra spaces
Consistently use '0x' prefix for bitfield-like constants
Spelling: "aplies" -> "applies"
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

`writeops' is unnecessary in the function `nand_update_bbt()'
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

There are a few reasons not to ignore ECC errors here.

First, mtd->read_oob is being called in raw mode, so there should be no
error correction in the first place.

Second, if we change this such that there *is* error correction in this
function, then we will want to pass the error message upward.

In fact, the code I introduced to "ignore ECC errors" would have been
better if it had just placed this test down in `scan_block_full()' in
the first place. We would like to ignore ECC errors when we are simply
checking for bad block markers (e.g., factory marked), but we may not
want to ignore ECC errors when scanning OOB for a flash-based BBT
pattern (in `scan_read_raw()'; note that the return codes from
`scan_read_raw()' are not actually handled yet).
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

A few pieces of code are unnecessarily duplicated. For easier
maintenance, we should fix this.

This should have no functional effect.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

These modes are not necessarily for OOB only. Particularly, MTD_OOB_RAW
affected operations on in-band page data as well. To clarify these
options and to emphasize that their effect is applied per-operation, we
change the primary prefix to MTD_OPS_.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Start moving away from the MTD_DEBUG_LEVEL messages. The dynamic
debugging feature is a generic kernel feature that provides more
flexibility.

(See Documentation/dynamic-debug-howto.txt)

Also fix some punctuation, indentation, and capitalization that went
along with the affected lines.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

This is a cleanup of some punctuation, indentation, and capitalization
on the lines affected affected by the last patch.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Instead of directly calling printk, it's simpler to use the built-in
pr_* functions. This shortens code and allows easy customization through
the definition of a pr_fmt() macro (not used currently). Ideally, we
could implement much of this with dev_* functions, but the MTD subsystem
does not necessarily register all its master `mtd_info.dev` device, so
we cannot use dev_* consistently. See:
http://lists.infradead.org/pipermail/linux-mtd/2011-July/036950.htmlSigned-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Soon we will change many printk statements into pr_* statements, i.e.,
'printk(KERN_INFO, ...)' becomes 'pr_info(...)'. However, this means that
KERN_DEBUG messages will become pr_debug() statements and therefore will
not be activated by default - they must be enabled using dynamic debug.
So, for important DEBUG messages, we will simply upgrade these to INFO
so that they appear by default.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>

Now that nand_do_readoob() may return -EUCLEAN or -EBADMSG on ECC errors,
we need to handle the return value specially in some cases.

When scanning for simple bad block markers, reacting to an ECC error is
not very useful, as we assume that the relevant markers are still
non-0xFF for true bad blocks.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <dedekind1@gmail.com>

Therefor -> Therefore
[Intern], [Internal] -> [INTERN]
[REPLACABLE] -> [REPLACEABLE]
syndrom, syndom -> syndrome
ecc -> ECC
buswith -> buswidth
endianess -> endianness
dont -> don't
occures -> occurs
independend -> independent
wihin -> within
erease -> erase
blockes -> blocks
...
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

When a memory allocation fails, the kernel will print out a backtrace
automatically. These print statements are unnecessary.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

Artem: while on it, do other commentaries clean-ups:
1. Start one-line comments with capital letter and no dot at the end
2. Turn sparse multi-line comments into one-line comments
3. Change "phrase ?" to "phrase?" and the same with "!".
4. Remove tabs from the kerneldoc parameters comments - they are mixed
   with tabs often, and inconsistent.
5. Put dot at the end of descriptions in kerneldoc comments.
6. Some other small commentaries clean-ups
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

According to our new prefix rules, we should rename NAND_CREATE_EMPTY_BBT
with a NAND_BBT prefix, i.e., NAND_BBT_CREATE_EMPTY.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

The NAND_CREATE_EMPTY_BBT flag was added by commit:
  453281a9
  mtd: nand: introduce NAND_CREATE_EMPTY_BBT
This flag is not used within the kernel and not explained well, so I
took the liberty to edit its comments.

Also, this is a BBT-related flag (and closely tied with NAND_BBT_CREATE)
so I'm moving it to bbm.h next to NAND_BBT_CREATE, thus requiring that
we use the flag in nand_chip.bbt_options, *not* in nand_chip.options.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

Recall the recently added prefix requirements:
 * "NAND_" for flags in nand.h, used in nand_chip.options
 * "NAND_BBT_" for flags in bbm.h, used in nand_chip.bbt_options
        or in nand_bbt_descr.options

Thus, I am changing NAND_USE_FLASH_BBT to NAND_BBT_USE_FLASH.

Again, this flag is found in bbm.h and so should NOT be used in the
"nand_chip.options" field.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This patch works with the following three flags from two headers (nand.h
and bbm.h):
  (1) NAND_USE_FLASH_BBT (nand.h)
  (2) NAND_USE_FLASH_BBT_NO_OOB (nand.h)
  (3) NAND_BBT_NO_OOB (bbm.h)

These flags are all related and interdependent, yet they were in
different headers. Flag (2) is simply the combination of (1) and (3) and
can be eliminated.

This patch accomplishes the following:
  * eliminate NAND_USE_FLASH_BBT_NO_OOB (i.e., flag (2))
  * move NAND_USE_FLASH_BBT (i.e., flag (1)) to bbm.h

It's important to note that because (1) and (3) are now both found in
bbm.h, they should NOT be used in the "nand_chip.options" field.

I removed a small section from the mtdnand DocBook because it referes to
NAND_USE_FLASH_BBT in nand.h, which has been moved to bbm.h.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This patch handles the problems we've been having with using conflicting
flags from nand.h and bbm.h in the same nand_chip.options field. We
should try to separate these two spaces a little more clearly, and so I
have added a bbt_options field to nand_chip.

Important notes about nand_chip fields:
* bbt_options field should contain ONLY flags from bbm.h. They should be
  able to pass safely to a nand_bbt_descr data structure.
    - BBT option flags start with the "NAND_BBT_" prefix.
* options field should contian ONLY flags from nand.h. Ideally, they
  should not be involved in any BBT related options.
    - NAND chip option flags start with the "NAND_" prefix.
* Every flag should have a nice comment explaining what the flag is. While
  this is not yet the case on all existing flags, please be sure to write
  one for new flags. Even better, you can help document the code better
  yourself!

Please try to follow these conventions to make everyone's lives easier.

Among the flags that are being moved to the new bbt_options field
throughout various drivers, etc. are:
 * NAND_BBT_SCANLASTPAGE
 * NAND_BBT_SCAN2NDPAGE
and there will be more to come.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This patch reverts most of:
    commit 58373ff0
    mtd: nand: more BB Detection refactoring and dynamic scan options

According to the discussion at:
    http://lists.infradead.org/pipermail/linux-mtd/2011-May/035696.html
the NAND_BBT_SCANBYTE1AND6 flag, although technically valid, can break
some existing ECC layouts that use the 6th byte in the OOB for ECC data.
Furthermore, we apparently do not need to scan both bytes 1 and 6 in
the OOB region of the devices under consideration; instead, we only need
to scan one or the other.

Thus, the NAND_BBT_SCANBYTE1AND6 flag is at best unnecessary and at
worst a regression.
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

It is nicer to dynamically create our badblock patterns than to
statically define them. The nand_create_default_bbt_descr() function
does a sufficient job of handling various bad block scanning options
for either flash-based or non-flash-based BBTs, so we might as well
use the function for both cases.

This patch simplifies and shortens our code (and removes a TODO that
I left a few months ago).
Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

Fixes generated by 'codespell' and manually reviewed.
Signed-off-by: NLucas De Marchi <lucas.demarchi@profusion.mobi>

In 'verify_bbt_descr()', first check the "bd" pointer, then
dereference it.

Comments amended by Artem.
Signed-off-by: NStanislav Fomichev <kernel@fomichev.me>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

Warning(include/linux/mtd/nand.h:543): No description found for parameter 'badblockbits'
Warning(drivers/mtd/nand/nand_bbt.c:1101): No description found for parameter 'mtd'
Signed-off-by: NRandy Dunlap <randy.dunlap@oracle.com>
Cc:	David Woodhouse <dwmw2@infradead.org>
Cc:	linux-mtd@lists.infradead.org
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

it will create an empty BBT table without considering vendor's BBT
information. Vendor's information may be unavailable if the NAND
controller has a different DATA & OOB layout or this information may be
allready purged.
Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

The first (sixt) byte in the OOB area contains vendor's bad block
information. During identification of the NAND chip this information is
collected by scanning the complete chip.
The option NAND_USE_FLASH_BBT is used to store this information in a sector so
we don't have to scan the complete flash. Unfortunately the code stores
a marker in order to recognize the BBT in the OOB area. This will fail
if the OOB area is completely used for ECC.
This patch introduces the option NAND_USE_FLASH_BBT_NO_OOB which has to be
used with NAND_USE_FLASH_BBT. It will then store BBT on flash without
touching the OOB area. The BBT format on flash remains same except the
first page starts with the recognition pattern followed by the version byte.
This change was tested in nandsim and it looks good so far :)
Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

No code change.
Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>