test仓库新增device_attest和device_attst_lite

Signed-off-by: N徐山山 <xushanshan11@huawei.com>

sig/sig-test/sig_test.md

@@ -21,6 +21,8 @@ Note: The content of this SIG follows the convention described in OpenHarmony's
   - https://gitee.com/openharmony/xts_tools
   - https://gitee.com/openharmony/xts_hats
   - https://gitee.com/openharmony/xts_dcts
+  - https://gitee.com/openharmony/xts_device_attest
+  - https://gitee.com/openharmony/xts_device_attest_lite
   - https://gitee.com/openharmony/ostest_wukong
   - https://gitee.com/openharmony/testfwk_arkxtest
   - https://gitee.com/openharmony/testfwk_xdevice

sig/sig-test/sig_test_cn.md

@@ -34,6 +34,8 @@ Test-SIG（ sig-Test ）技术栈范围全景图如下图所示：
   - https://gitee.com/openharmony/xts_tools
   - https://gitee.com/openharmony/xts_hats
   - https://gitee.com/openharmony/xts_dcts
+  - https://gitee.com/openharmony/xts_device_attest
+  - https://gitee.com/openharmony/xts_device_attest_lite
   - https://gitee.com/openharmony/ostest_wukong
   - https://gitee.com/openharmony/testfwk_arkxtest
   - https://gitee.com/openharmony/testfwk_xdevice