1. 21 5月, 2015 1 次提交
  2. 15 5月, 2015 2 次提交
    • P
      test: dm: test.dts - move to sandbox dts directory · f64000c3
      Przemyslaw Marczak 提交于
      The file test.dts from driver model test directory,
      was compiled by call dtc in script: test/dm/test-dm.sh.
      
      This doesn't allow for including of dtsi files and using
      of C preprocessor routines in this dts file.
      
      Since the mentioned script builds U-Boot before tests,
      then moving the test.dts file into sandbox dts directory
      is reasonable.
      Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com>
      Acked-by: NSimon Glass <sjg@chromium.org>
      Tested on sandbox:
      Tested-by: NSimon Glass <sjg@chromium.org>
      f64000c3
    • P
      test: dm: add sandbox PMIC framework tests · e8f339e0
      Przemyslaw Marczak 提交于
      This change adds new file to sandbox driver model test environment.
      The file is: test/dm/power.c, and it includes tests for PMIC framework,
      which includes PMIC uclass and REGULATOR uclass.
      
      All tests are based od Sandbox PMIC emulated device. Some test constants for
      this device are defined in the header: include/power/sandbox_pmic.h
      
      PMIC tests includes:
      - pmic get - tests, that pmic_get() returns the requested device
      - pmic I/O - tests I/O by writing and reading some values to PMIC's registers
                   and then compares, that the write/read values are equal.
      
      The regulator tests includes:
      - Regulator get by devname/platname
      - Voltage set/get
      - Current set/get
      - Enable set/get
      - Mode set/get
      - Autoset
      - List autoset
      
      For the regulator 'get' test, the returned device pointers are compared,
      and their names are also compared to the requested one.
      Every other test, first sets the given attribute and next try to get it.
      The test pass, when the set/get values are equal.
      Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com>
      Acked-by: NSimon Glass <sjg@chromium.org>
      Tested on sandbox:
      Tested-by: NSimon Glass <sjg@chromium.org>
      e8f339e0
  3. 06 5月, 2015 4 次提交
  4. 23 4月, 2015 4 次提交
    • S
      dm: test: Don't clear global_data in dm_test_uclass_before_ready() · f9fd4558
      Simon Glass 提交于
      We must not clear global_data even in tests, since the ram_buffer (which
      is used by malloc()) will also be lost, and subsequent tests will fail.
      
      Zero only the global_data fields that are required for the test to function.
      Signed-off-by: NSimon Glass <sjg@chromium.org>
      Reviewed-by: NJoe Hershberger <joe.hershberger@ni.com>
      Tested-by: NJoe Hershberger <joe.hershberger@ni.com>
      f9fd4558
    • P
      dm: test: Add tests for get/find uclass's device by name · 6e0c4880
      Przemyslaw Marczak 提交于
      This commit introduces simple tests for functions:
      - uclass_find_device_by_name()
      - uclass_get_device_by_name()
      
      Tests added by this commit:
      - Test: dm_test_uclass_devices_find_by_name: for uclass id: UCLASS_TEST_FDT
       * get uclass's devices by uclass_find_first/next_device() each as 'testdev',
       * for each returned device, call: uclass_find_device_by_name(),
         with previously returned device's name as an argument ('testdev->name').
       * for the found device ('founddev') check if:
         * founddev != NULL
         * testdev == founddev
         * testdev->name == founddev->name (by strcmp)
      
      - Test: dm_test_uclass_devices_get_by_name: for uclass id: UCLASS_TEST_FDT
       * get uclass's devices by uclass_get_first/next_device() each as 'testdev',
       * for each returned device, call: uclass_get_device_by_name(),
         with previously returned device's name as an argument ('testdev->name').
       * for the found device ('founddev') check if:
         * founddev != NULL
         * founddev is active
         * testdev == founddev
         * testdev->name == founddev->name (by strcmp)
      Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com>
      Cc: Simon Glass <sjg@chromium.org>
      Acked-by: NSimon Glass <sjg@chromium.org>
      6e0c4880
    • P
      dm: test: Add tests for get/find uclass devices · 9e85f13d
      Przemyslaw Marczak 提交于
      This commit introduces simple tests for functions:
      - uclass_find_first_device()
      - uclass_find_next_device()
      - uclass_first_device()
      - uclass_next_device()
      
      Tests added by this commit:
      - Test: dm_test_uclass_devices_find:
        * call uclass_find_first_device(), then check if: (dev != NULL), (ret == 0)
        * for the rest devices, call uclass_find_next_device() and do the same check
      
      - Test: dm_test_uclass_devices_get:
        * call uclass_first_device(), then check if:
          -- (dev != NULL), (ret == 0), device_active()
        * for the rest devices, call uclass_next_device() and do the same check
      Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com>
      Cc: Simon Glass <sjg@chromium.org>
      Acked-by: NSimon Glass <sjg@chromium.org>
      9e85f13d
    • P
      dm: test: Add tests for device's uclass platform data · 754e71e8
      Przemyslaw Marczak 提交于
      This test introduces new test structure type:dm_test_perdev_uc_pdata.
      The structure consists of three int values only. For the test purposes,
      three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1.
      
      This commit adds two test cases for uclass platform data:
      - Test: dm_test_autobind_uclass_pdata_alloc - this tests if:
        * uclass driver sets: .per_device_platdata_auto_alloc_size field
        * the devices's: dev->uclass_platdata is non-NULL
      
      - Test: dm_test_autobind_uclass_pdata_valid - this tests:
        * if the devices's: dev->uclass_platdata is non-NULL
        * the structure of type 'dm_test_perdev_uc_pdata' allocated at address
          pointed by dev->uclass_platdata. Each structure field, should be equal
          to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1.
      Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com>
      Cc: Simon Glass <sjg@chromium.org>
      Acked-by: NSimon Glass <sjg@chromium.org>
      754e71e8
  5. 19 4月, 2015 16 次提交
  6. 17 4月, 2015 3 次提交
  7. 13 2月, 2015 2 次提交
  8. 30 1月, 2015 8 次提交