This commit adds unit tests for ADC uclass's methods using sandbox ADC.

Testing proper ADC binding:
- dm_test_adc_bind()                    - device binding
- dm_test_adc_wrong_channel_selection() - checking wrong channel selection

Testing ADC supply operations:
- dm_test_adc_supply():
  - Vdd/Vss values validating
  - Vdd regulator updated value validating
  - Vdd regulator's auto enable state validating

Testing ADC operations results:
- dm_test_adc_single_channel_conversion() - single channel start/data
- dm_test_adc_single_channel_shot()       - single channel shot
- dm_test_adc_multi_channel_conversion()  - multi channel start/data
- dm_test_adc_multi_channel_shot()        - multi channel single shot
Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Signed-off-by: NMinkyu Kang <mk7.kang@samsung.com>

Use the sandbox environment for the basic tests.
Reviewed-by: NSimon Glass <sjg@chromium.org>
Tested-by: NSimon Glass <sjg@chromium.org>
Signed-off-by: NNishanth Menon <nm@ti.com>
Acked-by: NSimon Glass <sjg@chromium.org>

We use syscon to test that the regmap functions work as expected.
Signed-off-by: NSimon Glass <sjg@chromium.org>

Add a test to confirm that we can access system controllers and find their
driver data.
Signed-off-by: NSimon Glass <sjg@chromium.org>

Add a test to confirm that we can adjust LEDs using the led_gpio driver.
Signed-off-by: NSimon Glass <sjg@chromium.org>

Add a test to confirm that we can probe this device. Since there is no
MMC stack support in sandbox at present, this is as far as the test goes.
Signed-off-by: NSimon Glass <sjg@chromium.org>

Add a test to confirm that we can probe this device and get information on
the available RAM.
Signed-off-by: NSimon Glass <sjg@chromium.org>

Add tests that confirm that the drivers work as expected, and we can walk
through the available reset types trying to reset the board.
Signed-off-by: NSimon Glass <sjg@chromium.org>

Add tests of each API call using a sandbox clock device.
Signed-off-by: NSimon Glass <sjg@chromium.org>

Unify the command for running unit tests further by moving the "dm test"
command over to "ut dm".
Signed-off-by: NJoe Hershberger <joe.hershberger@ni.com>
Acked-by: NSimon Glass <sjg@chromium.org>

Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.
Signed-off-by: NJoe Hershberger <joe.hershberger@ni.com>
Reviewed-by: NSimon Glass <sjg@chromium.org>

This change adds new file to sandbox driver model test environment.
The file is: test/dm/power.c, and it includes tests for PMIC framework,
which includes PMIC uclass and REGULATOR uclass.

All tests are based od Sandbox PMIC emulated device. Some test constants for
this device are defined in the header: include/power/sandbox_pmic.h

PMIC tests includes:
- pmic get - tests, that pmic_get() returns the requested device
- pmic I/O - tests I/O by writing and reading some values to PMIC's registers
             and then compares, that the write/read values are equal.

The regulator tests includes:
- Regulator get by devname/platname
- Voltage set/get
- Current set/get
- Enable set/get
- Mode set/get
- Autoset
- List autoset

For the regulator 'get' test, the returned device pointers are compared,
and their names are also compared to the requested one.
Every other test, first sets the given attribute and next try to get it.
The test pass, when the set/get values are equal.
Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com>
Acked-by: NSimon Glass <sjg@chromium.org>
Tested on sandbox:
Tested-by: NSimon Glass <sjg@chromium.org>

Add some simple tests to verify that the RTC uclass works correctly in
U-Boot.
Signed-off-by: NSimon Glass <sjg@chromium.org>

This adds a simple test for probing and a functional test using the flash
stick emulator, which tests a large chunk of the USB stack.
Signed-off-by: NSimon Glass <sjg@chromium.org>
Reviewed-by: NMarek Vasut <marex@denx.de>

Add a test for the eth uclass using the sandbox eth driver. Verify basic
functionality of the network stack / eth uclass by exercising the ping
function.
Signed-off-by: NJoe Hershberger <joe.hershberger@ni.com>
Reviewed-by: NSimon Glass <sjg@chromium.org>

Signed-off-by: NJoe Hershberger <joe.hershberger@ni.com>
Acked-by: NSimon Glass <sjg@chromium.org>

Add some basic tests to check that things work as expected with sandbox.
Signed-off-by: NSimon Glass <sjg@chromium.org>

Add some basic tests to check that the system works as expected.
Signed-off-by: NSimon Glass <sjg@chromium.org>
Acked-by: NHeiko Schocher <hs@denx.de>

Add a simple test for SPI that uses SPI flash. It operates by creating a
SPI flash file and using the 'sf test' command to test that all
operations work correctly.
Signed-off-by: NSimon Glass <sjg@chromium.org>
Acked-by: NJagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>

These tests use SPI flash (and the sandbox emulation) to operate.
Signed-off-by: NSimon Glass <sjg@chromium.org>
Acked-by: NJagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>

At present only root nodes in the device tree are scanned for devices.
But some devices can have children. For example a SPI bus may have
several children for each of its chip selects.

Add a function which scans subnodes and binds devices for each one. This
can be used for the root node scan also, so change it.

A device can call this function in its bind() or probe() methods to bind
its children.
Signed-off-by: NSimon Glass <sjg@chromium.org>

The GPIO tests require the sandbox GPIO driver, so cannot be run on other
platforms. Similarly for the 'dm test' command.
Signed-off-by: NSimon Glass <sjg@chromium.org>

This command is not required for driver model operation, but can be useful
for testing. It provides simple dumps of internal data structures.
Signed-off-by: NSimon Glass <sjg@chromium.org>
Signed-off-by: NMarek Vasut <marex@denx.de>
Signed-off-by: NPavel Herrmann <morpheus.ibis@gmail.com>
Signed-off-by: NViktor Křivák <viktor.krivak@gmail.com>
Signed-off-by: NTomas Hlavacek <tmshlvck@gmail.com>

Add some tests of driver model functionality. Coverage includes:

- basic init
- binding of drivers to devices using platform_data
- automatic probing of devices when referenced
- availability of platform data to devices
- lifecycle from bind to probe to remove to unbind
- renumbering within a uclass when devices are probed/removed
- calling driver-defined operations
- deactivation of drivers when removed
- memory leak across creation and destruction of drivers/uclasses
- uclass init/destroy methods
- automatic probe/remove of children/parents when needed

This function is enabled for sandbox, using CONFIG_DM_TEST.
Signed-off-by: NSimon Glass <sjg@chromium.org>