- 18 3月, 2016 1 次提交
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由 Simon Glass 提交于
Add some tests to check that block devices work as expected. Signed-off-by: NSimon Glass <sjg@chromium.org> Tested-by: NStephen Warren <swarren@nvidia.com>
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- 26 2月, 2016 1 次提交
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由 Simon Glass 提交于
These are working correctly again, so re-enable them. Signed-off-by: NSimon Glass <sjg@chromium.org> Reviewed-by: NJagan Teki <jteki@openedev.com> Tested-by: NJagan Teki <jteki@openedev.com>
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- 21 1月, 2016 1 次提交
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由 Simon Glass 提交于
Add tests that check that the video console is working correcty. Also check that text output produces the expected result. Test coverage includes character output, wrapping and scrolling. Signed-off-by: NSimon Glass <sjg@chromium.org> Acked-by: NAnatolij Gustschin <agust@denx.de>
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- 08 1月, 2016 1 次提交
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由 Simon Glass 提交于
This subsystem has been broken since commit: 4efad20a sf: Update status reg check in spi_flash_cmd_wait_ready There has so far been no response from the maintainer, and a release is imminent. For now, let's just disable the tests. Signed-off-by: NSimon Glass <sjg@chromium.org>
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- 20 11月, 2015 1 次提交
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由 Thomas Chou 提交于
Add a sandbox timer which get time from host os and a basic test. Signed-off-by: NThomas Chou <thomas@wytron.com.tw> Reviewed-by: NSimon Glass <sjg@chromium.org>
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- 02 11月, 2015 1 次提交
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由 Przemyslaw Marczak 提交于
This commit adds unit tests for ADC uclass's methods using sandbox ADC. Testing proper ADC binding: - dm_test_adc_bind() - device binding - dm_test_adc_wrong_channel_selection() - checking wrong channel selection Testing ADC supply operations: - dm_test_adc_supply(): - Vdd/Vss values validating - Vdd regulator updated value validating - Vdd regulator's auto enable state validating Testing ADC operations results: - dm_test_adc_single_channel_conversion() - single channel start/data - dm_test_adc_single_channel_shot() - single channel shot - dm_test_adc_multi_channel_conversion() - multi channel start/data - dm_test_adc_multi_channel_shot() - multi channel single shot Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com> Cc: Simon Glass <sjg@chromium.org> Signed-off-by: NMinkyu Kang <mk7.kang@samsung.com>
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- 23 10月, 2015 1 次提交
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由 Nishanth Menon 提交于
Use the sandbox environment for the basic tests. Reviewed-by: NSimon Glass <sjg@chromium.org> Tested-by: NSimon Glass <sjg@chromium.org> Signed-off-by: NNishanth Menon <nm@ti.com> Acked-by: NSimon Glass <sjg@chromium.org>
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- 22 7月, 2015 7 次提交
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由 Simon Glass 提交于
We use syscon to test that the regmap functions work as expected. Signed-off-by: NSimon Glass <sjg@chromium.org>
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由 Simon Glass 提交于
Add a test to confirm that we can access system controllers and find their driver data. Signed-off-by: NSimon Glass <sjg@chromium.org>
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由 Simon Glass 提交于
Add a test to confirm that we can adjust LEDs using the led_gpio driver. Signed-off-by: NSimon Glass <sjg@chromium.org>
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由 Simon Glass 提交于
Add a test to confirm that we can probe this device. Since there is no MMC stack support in sandbox at present, this is as far as the test goes. Signed-off-by: NSimon Glass <sjg@chromium.org>
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由 Simon Glass 提交于
Add a test to confirm that we can probe this device and get information on the available RAM. Signed-off-by: NSimon Glass <sjg@chromium.org>
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由 Simon Glass 提交于
Add tests that confirm that the drivers work as expected, and we can walk through the available reset types trying to reset the board. Signed-off-by: NSimon Glass <sjg@chromium.org>
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由 Simon Glass 提交于
Add tests of each API call using a sandbox clock device. Signed-off-by: NSimon Glass <sjg@chromium.org>
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- 21 5月, 2015 2 次提交
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由 Joe Hershberger 提交于
Unify the command for running unit tests further by moving the "dm test" command over to "ut dm". Signed-off-by: NJoe Hershberger <joe.hershberger@ni.com> Acked-by: NSimon Glass <sjg@chromium.org>
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由 Joe Hershberger 提交于
Separate the ability to define tests and assert status of test functions from the dm tests so they can be used more consistently throughout all tests. Signed-off-by: NJoe Hershberger <joe.hershberger@ni.com> Reviewed-by: NSimon Glass <sjg@chromium.org>
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- 15 5月, 2015 1 次提交
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由 Przemyslaw Marczak 提交于
This change adds new file to sandbox driver model test environment. The file is: test/dm/power.c, and it includes tests for PMIC framework, which includes PMIC uclass and REGULATOR uclass. All tests are based od Sandbox PMIC emulated device. Some test constants for this device are defined in the header: include/power/sandbox_pmic.h PMIC tests includes: - pmic get - tests, that pmic_get() returns the requested device - pmic I/O - tests I/O by writing and reading some values to PMIC's registers and then compares, that the write/read values are equal. The regulator tests includes: - Regulator get by devname/platname - Voltage set/get - Current set/get - Enable set/get - Mode set/get - Autoset - List autoset For the regulator 'get' test, the returned device pointers are compared, and their names are also compared to the requested one. Every other test, first sets the given attribute and next try to get it. The test pass, when the set/get values are equal. Signed-off-by: NPrzemyslaw Marczak <p.marczak@samsung.com> Acked-by: NSimon Glass <sjg@chromium.org> Tested on sandbox: Tested-by: NSimon Glass <sjg@chromium.org>
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- 06 5月, 2015 1 次提交
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由 Simon Glass 提交于
Add some simple tests to verify that the RTC uclass works correctly in U-Boot. Signed-off-by: NSimon Glass <sjg@chromium.org>
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- 19 4月, 2015 4 次提交
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由 Simon Glass 提交于
This adds a simple test for probing and a functional test using the flash stick emulator, which tests a large chunk of the USB stack. Signed-off-by: NSimon Glass <sjg@chromium.org> Reviewed-by: NMarek Vasut <marex@denx.de>
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由 Joe Hershberger 提交于
Add a test for the eth uclass using the sandbox eth driver. Verify basic functionality of the network stack / eth uclass by exercising the ping function. Signed-off-by: NJoe Hershberger <joe.hershberger@ni.com> Reviewed-by: NSimon Glass <sjg@chromium.org>
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由 Joe Hershberger 提交于
Signed-off-by: NJoe Hershberger <joe.hershberger@ni.com> Acked-by: NSimon Glass <sjg@chromium.org>
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由 Simon Glass 提交于
Add some basic tests to check that things work as expected with sandbox. Signed-off-by: NSimon Glass <sjg@chromium.org>
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- 12 12月, 2014 1 次提交
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由 Simon Glass 提交于
Add some basic tests to check that the system works as expected. Signed-off-by: NSimon Glass <sjg@chromium.org> Acked-by: NHeiko Schocher <hs@denx.de>
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- 23 10月, 2014 2 次提交
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由 Simon Glass 提交于
Add a simple test for SPI that uses SPI flash. It operates by creating a SPI flash file and using the 'sf test' command to test that all operations work correctly. Signed-off-by: NSimon Glass <sjg@chromium.org> Acked-by: NJagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>
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由 Simon Glass 提交于
These tests use SPI flash (and the sandbox emulation) to operate. Signed-off-by: NSimon Glass <sjg@chromium.org> Acked-by: NJagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>
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- 23 7月, 2014 1 次提交
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由 Simon Glass 提交于
At present only root nodes in the device tree are scanned for devices. But some devices can have children. For example a SPI bus may have several children for each of its chip selects. Add a function which scans subnodes and binds devices for each one. This can be used for the root node scan also, so change it. A device can call this function in its bind() or probe() methods to bind its children. Signed-off-by: NSimon Glass <sjg@chromium.org>
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- 21 6月, 2014 1 次提交
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由 Simon Glass 提交于
The GPIO tests require the sandbox GPIO driver, so cannot be run on other platforms. Similarly for the 'dm test' command. Signed-off-by: NSimon Glass <sjg@chromium.org>
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- 05 3月, 2014 2 次提交
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由 Simon Glass 提交于
This command is not required for driver model operation, but can be useful for testing. It provides simple dumps of internal data structures. Signed-off-by: NSimon Glass <sjg@chromium.org> Signed-off-by: NMarek Vasut <marex@denx.de> Signed-off-by: NPavel Herrmann <morpheus.ibis@gmail.com> Signed-off-by: NViktor Křivák <viktor.krivak@gmail.com> Signed-off-by: NTomas Hlavacek <tmshlvck@gmail.com>
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由 Simon Glass 提交于
Add some tests of driver model functionality. Coverage includes: - basic init - binding of drivers to devices using platform_data - automatic probing of devices when referenced - availability of platform data to devices - lifecycle from bind to probe to remove to unbind - renumbering within a uclass when devices are probed/removed - calling driver-defined operations - deactivation of drivers when removed - memory leak across creation and destruction of drivers/uclasses - uclass init/destroy methods - automatic probe/remove of children/parents when needed This function is enabled for sandbox, using CONFIG_DM_TEST. Signed-off-by: NSimon Glass <sjg@chromium.org>
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