提交 1ab1ffde 编写于 作者: B Bryan O'Donoghue 提交者: Stefano Babic

imx: mx7: Add comment to describe OTP TESTER registers

The tester registers provide a unique chip-level identifier which
get_board_serial() returns in a "struct tag_serialnr".

This patch documents the properties of the registers; in summary.

31:0 OCOTP_TESTER0 (most significant)
- FSL-wide unique, encoded LOT ID STD II/SJC CHALLENGE/ Unique ID

OCOTP_TESTER1 (least significant)
31:24
- The X-coordinate of the die location on the wafer/SJC CHALLENGE/ Unique
  ID
23:16
- The Y-coordinate of the die location on the wafer/SJC CHALLENGE/ Unique
  ID
15:11
- The wafer number of the wafer on which the device was fabricated/SJC
  CHALLENGE/ Unique ID
10:0
- FSL-wide unique, encoded LOT ID STD II/SJC CHALLENGE/ Unique ID

The 64 bits of data generate a unique serial number per-chip.
Signed-off-by: NBryan O'Donoghue <bryan.odonoghue@linaro.org>
Cc: Fabio Estevam <fabio.estevam@nxp.com>
Cc: Peng Fan <peng.fan@nxp.com>
Cc: Stefano Babic <sbabic@denx.de>
Reviewed-by: NFabio Estevam <fabio.estevam@nxp.com>
上级 ca831822
......@@ -202,6 +202,27 @@ int arch_misc_init(void)
#endif
#ifdef CONFIG_SERIAL_TAG
/*
* OCOTP_TESTER
* i.MX 7Solo Applications Processor Reference Manual, Rev. 0.1, 08/2016
* OCOTP_TESTER describes a unique ID based on silicon wafer
* and die X/Y position
*
* OCOTOP_TESTER offset 0x410
* 31:0 fuse 0
* FSL-wide unique, encoded LOT ID STD II/SJC CHALLENGE/ Unique ID
*
* OCOTP_TESTER1 offset 0x420
* 31:24 fuse 1
* The X-coordinate of the die location on the wafer/SJC CHALLENGE/ Unique ID
* 23:16 fuse 1
* The Y-coordinate of the die location on the wafer/SJC CHALLENGE/ Unique ID
* 15:11 fuse 1
* The wafer number of the wafer on which the device was fabricated/SJC
* CHALLENGE/ Unique ID
* 10:0 fuse 1
* FSL-wide unique, encoded LOT ID STD II/SJC CHALLENGE/ Unique ID
*/
void get_board_serial(struct tag_serialnr *serialnr)
{
struct ocotp_regs *ocotp = (struct ocotp_regs *)OCOTP_BASE_ADDR;
......
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