!300 add hievent hal test

Merge pull request !300 from stesen/master

build_lite/BUILD.gn

@@ -42,6 +42,7 @@ lite_component("acts_component") {
         "//test/xts/acts/utils_lite/kv_store_hal:ActsKvStoreTest",
         #"//test/xts/acts/security_lite/huks_hal:ActsSecurityDataTest",
         "//test/xts/acts/hiviewdfx_lite/hilog_hal:ActsDfxFuncTest",
+        "//test/xts/acts/hiviewdfx_lite/hievent_hal:ActsHieventLiteTest",
 
         "//test/xts/acts/distributed_schedule_lite/system_ability_manager_hal:ActsSamgrTest",
         "//test/xts/acts/update_lite/dupdate_hal:ActsUpdaterFuncTest",

hiviewdfx_lite/hievent_hal/BUILD.gn

+ # Copyright (c) 2020 Huawei Device Co., Ltd.
+ # Licensed under the Apache License, Version 2.0 (the "License");
+ # you may not use this file except in compliance with the License.
+ # You may obtain a copy of the License at
+ #
+ #     http://www.apache.org/licenses/LICENSE-2.0
+ #
+ # Unless required by applicable law or agreed to in writing, software
+ # distributed under the License is distributed on an "AS IS" BASIS,
+ # WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+ # See the License for the specific language governing permissions and
+ # limitations under the License.
+
+import("//test/xts/tools/lite/build/suite_lite.gni")
+hctest_suite("ActsHieventLiteTest") {
+    suite_name = "acts"
+    sources = [
+        "src/hievent_lite_test.c",
+    ]
+
+    include_dirs = [
+        "src",
+        "//base/hiviewdfx/hievent_lite/interfaces/native/innerkits",
+    ]
+
+    cflags = [ "-Wno-error" ]
+}

hiviewdfx_lite/hievent_hal/Test.tmpl

+{
+    "description": "Config for $module test cases",
+    "environment": [
+        {
+            "type": "device",
+            "label": "wifiiot"
+        }
+    ],
+    "kits": [
+        {
+            "type": "DeployKit",
+            "timeout": "20000",
+            "burn_file": "$subsystem/$module.bin"
+        }
+    ],
+    "driver": {
+        "type": "CTestLite"
+    }
+}
\ No newline at end of file

hiviewdfx_lite/hievent_hal/src/hievent_lite_test.c

+/*
+ * Copyright (c) 2021 Huawei Device Co., Ltd.
+ * Licensed under the Apache License, Version 2.0 (the "License");
+ * you may not use this file except in compliance with the License.
+ * You may obtain a copy of the License at
+ *
+ *     http://www.apache.org/licenses/LICENSE-2.0
+ *
+ * Unless required by applicable law or agreed to in writing, software
+ * distributed under the License is distributed on an "AS IS" BASIS,
+ * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+ * See the License for the specific language governing permissions and
+ * limitations under the License.
+ */
+
+#include <ctype.h>
+#include <stdint.h>
+#include "event.h"
+#include "hctest.h"
+
+#define HIEVENT_TEST_ID 0x1234
+
+/**
+ * @tc.desc      : register a test suite, this suite is used to test basic flow and interface dependency
+ * @param        : subsystem name is hiviewdfx
+ * @param        : module name is hievet_lite
+ * @param        : test suit name is HieventLiteTest
+ */
+LITE_TEST_SUIT(hiviewdfx, hievent_lite, HieventLiteTest);
+
+/**
+ * @tc.setup     : setup for all testcases
+ * @return       : setup result, TRUE is success, FALSE is fail
+ */
+static BOOL HieventLiteTestSuiteSetUp(void)
+{
+    return TRUE;
+}
+
+/**
+ * @tc.teardown  : teardown for all testcases
+ * @return       : teardown result, TRUE is success, FALSE is fail
+ */
+static BOOL HieventLiteTestSuiteTearDown(void)
+{
+    printf("+-------------------------------------------+\n");
+    return TRUE;
+}
+
+/**
+ * @tc.desc      : register a test suite, this suite is used to test basic flow and interface dependency
+ * @param        : subsystem name is hiviewdfx
+ * @param        : module name is hievet_lite
+ * @param        : test suit name is HieventLiteTest
+ */
+static HieventProc HieventLiteTestOutputFunc(uint8 *data)
+{
+    HiEvent *e = (HiEvent *)data;
+
+    TEST_ASSERT_EQUAL_INT(HIEVENT_TEST_ID, e->common.eventId);
+}
+
+/**
+ * @tc.name      : HieventLiteFuncTest001
+ * @tc.desc      : Test HiEventCreate
+ * @tc.level     : Level 1
+ */
+LITE_TEST_CASE(HieventLiteTestSuite, HieventLiteFuncTest001, Level1)
+{
+    HiEvent *e = HiEventCreate(HIEVENT_FAULT, 0, 3);
+
+    TEST_ASSERT_NOT_NULL(e);
+
+    HiEventReport(e);
+};
+
+/**
+ * @tc.name      : HieventLiteFuncTest002
+ * @tc.desc      : Test HiEventPutInteger 3 items whth async flush
+ * @tc.level     : Level 1
+ */
+LITE_TEST_CASE(HieventLiteTestSuite, HieventLiteFuncTest002, Level1)
+{
+    HiEvent *e = HiEventCreate(HIEVENT_FAULT, 1, 3);
+
+    TEST_ASSERT_NOT_NULL(e);
+
+    HiEventPutInteger(e, 1, 0);
+
+    HiEventReport(e);
+
+    HiEventFlush(FALSE);
+};
+
+/**
+ * @tc.name      : HieventLiteFuncTest003
+ * @tc.desc      : Test HiEventCreate
+ * @tc.level     : Level 1
+ */
+LITE_TEST_CASE(HieventLiteTestSuite, HieventLiteFuncTest003, Level1)
+{
+    HiEvent *e = HiEventCreate(HIEVENT_FAULT, HIEVENT_TEST_ID, 3);
+
+    HiEventRegisterProc(HieventLiteTestOutputFunc);
+
+    TEST_ASSERT_NOT_NULL(e);
+
+    HiEventPutInteger(e, 1, 0);
+    HiEventPutInteger(e, 2, 10);
+    HiEventPutInteger(e, 3, 20);
+
+    HiEventReport(e);
+    HiEventFlush(TRUE);
+    HiEventUnRegisterProc(HieventLiteTestOutputFunc);
+};
+
+/**
+ * @tc.name      : HieventLiteFuncTest004
+ * @tc.desc      : Test HiEventCreate
+ * @tc.level     : Level 1
+ */
+LITE_TEST_CASE(HieventLiteTestSuite, HieventLiteFuncTest004, Level1)
+{
+    HIEVENT_FAULT_REPORT(8, 1, 2);
+};
+