- 25 10月, 2010 11 次提交
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由 Jon Povey 提交于
RAW writes were broken by 782ce79a which introduced a check of ops->ooboffs in nand_do_write_ops(). When writing in RAW mode this is called with an ops struct on the stack of mtdchar.c:mtd_write() which does not initialise ops->ooboffs, so it is garbage and fails this test. This test does not make sense if ops->oobbuf is NULL, which it is in the RAW write path, so include that in the test. Signed-off-by: NJon Povey <jon.povey@racelogic.co.uk> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Huang Shijie 提交于
Not all the NAND devices have all the information in additional id bytes. So add a hook in the nand_chip{} is a good method to calculate the right value of oobsize, erasesize and so on. Without the hook,you will get the wrong value, and you have to hack in the ->scan_bbt() to change the wrong value which make the code mess. Signed-off-by: NHuang Shijie <shijie8@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Artem Bityutskiy 提交于
Currently MTD caches the last read NAND page, even if there was an uncorrectable ECC error. This patch prevents caching in case of uncorrectable ECC errors. The reason is that we want to allow the user to re-read the NAND page several times. In case of unstable bits re-trying may help. Moreover, current behavior is wrong because the first read returns -EBADMSG (correctly) but the second read succeeds and incorrectly returns 0 (because we read from the cache). Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Florian Fainelli 提交于
Only 3 warnings are left, one is off by one character, but splitting the line would reduce the readability. One is for a for loop statement, which would also not improve readability. The last one is a false positive on a test. Artem: it is much easier to verify patches against nand_base.c with checkpatch.pl when nand_base.c itself does not have so many checkpatch.pl warnings. Signed-off-by: NFlorian Fainelli <ffainelli@freebox.fr> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Florian Fainelli 提交于
Artem: it is much easier to verify patches against nand_base.c with checkpatch.pl when nand_base.c itself does not have so many checkpatch.pl warnings. Signed-off-by: NFlorian Fainelli <ffainelli@freebox.fr> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Florian Fainelli 提交于
In order to reduce the indentation and improve the readability of nand_get_ flash_type, split the ONFI detection logic to its own function. The detection logic inside nand_flash_detect_onfi is also rewritten to allow for less indentation. Signed-off-by: NFlorian Fainelli <ffainelli@freebox.fr> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Florian Fainelli 提交于
This patch adds support for reading NAND device ONFI parameters and use the ONFI informations to define its geometry. In case the device supports ONFI, the onfi_version field in struct nand_chip contains the version (BCD) and the onfi_params structure can be used by drivers to set up timings and such. We currently only support ONFI 1.0 parameters. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NMatthieu Castet <matthieu.castet@parrot.com> Signed-off-by: NMaxime Bizon <mbizon@freebox.fr> Signed-off-by: NFlorian Fainelli <ffainelli@freebox.fr> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
There are some additions to the detection scheme used by Samsung MLC NAND. These simple changes to support the 400- and 436-byte OOB are found in the following data sheet: Samsung K9GBG08U0M (p.40) Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
Toshiba does not use ONFI for their NAND flash. So we have to continue to add new IDs used by Toshiba devices as well as heuristic detection for scanning the 2nd page for a BBM. This is a relatively harmless start at supporting many of them. These chips mostly follow the same ID fields of previous generations, but there is a need for a tweak. These chips introduce a strange 576 byte OOB (that's 36 bytes per 512 bytes of page). In the preliminary data, Toshiba has not defined exactly how their ID strings should decode. In the future, a new tweak must be added. Data is taken from, among others, Toshiba TC58TxG4S2FBAxx Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
Some Spansion chips have a method for determining eraseblock size that is incompatible with similar ID chips of other sizes. This implements some heuristic detection of these differences. This patch checks for a 5-byte ID with trailing zeros as well as a 512-byte page size to ensure that chips are not misdetected as the S30MLxxxP ORNAND series. [Tweaked by Artem a bit] Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Baruch Siach 提交于
Drivers may (and do) return negative errno values other than -1 from the ecc.correct callback. Signed-off-by: NBaruch Siach <baruch@tkos.co.il> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 21 8月, 2010 1 次提交
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由 Tilman Sauerbeck 提交于
Apparently, the check for a 6-byte ID string introduced by commit 426c457a ("mtd: nand: extend NAND flash detection to new MLC chips") is NOT sufficient to determine whether or not a Samsung chip uses their new MLC detection scheme or the old, standard scheme. This adds a condition to check cell type. Signed-off-by: NTilman Sauerbeck <tilman@code-monkey.de> Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com> Cc: stable@kernel.org
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- 19 8月, 2010 1 次提交
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由 Brian Norris 提交于
Commit c7b28e25 ("mtd: nand: refactor BB marker detection") caused a regression in detection of factory-set bad block markers, especially for certain small-page NAND. This fix removes some unneeded constraints on using NAND_SMALL_BADBLOCK_POS, making the detection code more correct. This regression can be seen, for example, in Hynix HY27US081G1M and similar. Signed-off-by: NBrian Norris <norris@broadcom.com> Tested-by: NMichael Guntsche <mike@it-loops.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 11 8月, 2010 2 次提交
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由 Randy Dunlap 提交于
Fix mtd/nand_base.c kernel-doc warnings and typos. Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'mtd' Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'ofs' Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'len' Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'invert' Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'mtd' Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'ofs' Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'len' Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'mtd' Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'ofs' Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'len' Warning(drivers/mtd/nand/nand_base.c:2087): No description found for parameter 'len' Signed-off-by: NRandy Dunlap <randy.dunlap@oracle.com> Cc: David Woodhouse <dwmw2@infradead.org> Signed-off-by: NAndrew Morton <akpm@linux-foundation.org> Signed-off-by: NLinus Torvalds <torvalds@linux-foundation.org>
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由 Randy Dunlap 提交于
Fix mtd/nand_base.c kernel-doc warnings and typos. Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'mtd' Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'ofs' Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'len' Warning(drivers/mtd/nand/nand_base.c:893): No description found for parameter 'invert' Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'mtd' Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'ofs' Warning(drivers/mtd/nand/nand_base.c:930): No description found for parameter 'len' Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'mtd' Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'ofs' Warning(drivers/mtd/nand/nand_base.c:987): No description found for parameter 'len' Warning(drivers/mtd/nand/nand_base.c:2087): No description found for parameter 'len' Signed-off-by: NRandy Dunlap <randy.dunlap@oracle.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 09 8月, 2010 1 次提交
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由 David Woodhouse 提交于
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 02 8月, 2010 4 次提交
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由 Brian Norris 提交于
This is an update that depends on the previous patches I sent. We can now write to all the appropriate BB marker locations (i.e. pages 1 AND 2, bytes 1 AND 6) with nand_default_block_markbad() if necessary, according to the flags marked in chip->options. Note that I removed the line: ofs += mtd->oobsize; Unless I am wrong, this line was completely unnecessary in the first place. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
This is a revision to PATCH 2/2 that I sent. Link: http://lists.infradead.org/pipermail/linux-mtd/2010-July/030911.html Added new flag for scanning of both bytes 1 and 6 of the OOB for a BB marker (instead of simply one or the other). The "check_pattern" and "check_short_pattern" functions were updated to include support for scanning the two different locations in the OOB. In order to handle increases in variety of necessary scanning patterns, I implemented dynamic memory allocation of nand_bbt_descr structs in new function 'nand_create_default_bbt_descr()'. This replaces some increasingly-unwieldy, statically-declared descriptors. It can replace several more (e.g. "flashbased" structs). However, I do not test the flashbased options personally. How this was tested: I referenced 30+ data sheets (covering 100+ parts), and I tested a selection of 10 different chips to varying degrees. Particularly, I tested the creation of bad-block descriptors and basic BB scanning on three parts: ST NAND04GW3B2D, 2K page ST NAND128W3A, 512B page Samsung K9F1G08U0A, 2K page To test these, I wrote some fake bad block markers to the flash (in OOB bytes 1, 6, and elsewhere) to see if the scanning routine would detect them properly. However, this method was somewhat limited because the driver I am using has some bugs in its OOB write functionality. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
Some level of support for various scanning locations was already built in, but this required clean-up. First, BB marker location cannot be determined _only_ by the page size. Instead, I implemented some heuristic detection based on data sheets from various manufacturers (all found in nand_base.c:nand_get_flash_type()). Second, once these options were identified, they were not handled properly by nand_bbt.c:nand_default_bbt(). I updated the static nand_bbt_desc structs to reflect the need for more combinations of detection. The memory allocation here probably needs to be done dynamically in the very near future (see next patches). Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
NAND_BB_LAST_PAGE used to be in nand.h, but it pertained to bad block management and so belongs next to NAND_BBT_SCAN2NDPAGE in bbm.h. Also, its previous flag value (0x00000400) conflicted with NAND_BBT_SCANALLPAGES so I changed its value to 0x00008000. All uses of the name were modified to provide consistency with other "NAND_BBT_*" flags. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 14 5月, 2010 2 次提交
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由 Kevin Cernekee 提交于
This is a slightly modified version of a patch submitted last year by Reuben Dowle <reuben.dowle@navico.com>. His original comments follow: This patch adds support for some MLC NAND flashes that place the BB marker in the LAST page of the bad block rather than the FIRST page used for SLC NAND and other types of MLC nand. Lifted from Samsung datasheet for K9LG8G08U0A (1Gbyte MLC NAND): " Identifying Initial Invalid Block(s) All device locations are erased(FFh) except locations where the initial invalid block(s) information is written prior to shipping. The initial invalid block(s) status is defined by the 1st byte in the spare area. Samsung makes sure that the last page of every initial invalid block has non-FFh data at the column address of 2,048. ... " As far as I can tell, this is the same for all Samsung MLC nand, and in fact the samsung bsp for the processor used in our project (s3c6410) actually contained a hack similar to this patch but less portable to enable use of their NAND parts. I discovered this problem when trying to use a Micron NAND which does not used this layout - I wish samsung would put their stuff in main-line to avoid this type of problem. Currently this patch causes all MLC nand with manufacturer codes from Samsung and ST(Numonyx) to use this alternative location, since these are the manufactures that I know of that use this layout. Signed-off-by: NKevin Cernekee <cernekee@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Kevin Cernekee 提交于
Some of the newer MLC devices have a 6-byte ID sequence in which several field definitions differ from older chips in a manner that is not backward compatible. For instance: Samsung K9GAG08U0M (5-byte sequence): ec d5 14 b6 74 4th byte, bits 1:0 encode the page size: 0=1KiB, 1=2KiB, 2=4KiB, 3=8KiB 4th byte, bits 5:4 encode the block size: 0=64KiB, 1=128KiB, ... 4th byte, bit 6 encodes the OOB size: 0=8B/512B, 1=16B/512B Samsung K9GAG08U0D (6-byte sequence): ec d5 94 29 34 41 4th byte, bits 1:0 encode the page size: 0=2KiB, 1=4KiB, 3=8KiB, 4=rsvd 4th byte, bits 7;5:4 encode the block size: 0=128KiB, 1=256KiB, ... 4th byte, bits 6;3:2 encode the OOB size: 1=128B/page, 2=218B/page This patch uses the new 6-byte scheme if the following conditions are all true: 1) The ID code wraps around after exactly 6 bytes 2) Manufacturer is Samsung 3) 6th byte is zero The patch also extends the maximum OOB size from 128B to 256B. Signed-off-by: NKevin Cernekee <cernekee@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 27 2月, 2010 7 次提交
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由 Maxim Levitsky 提交于
Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 David Woodhouse 提交于
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Maxim Levitsky 提交于
This can be used to protect against bitflips in that field, but now mostly for smartmedia. Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Maxim Levitsky 提交于
This changes the behavier of MTD_OOB_RAW. It used to read both OOB and data to the data buffer, however you would still need to specify the dummy oob buffer. This is only used in one place, but makes it hard to read data+oob without ECC test, thus I removed that behavier, and fixed the user. Now MTD_OOB_RAW behaves just like MTD_OOB_PLACE, but doesn't do ECC validation Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Maxim Levitsky 提交于
nand_do_write_ops was broken in regard to writing several pages, each with its own oob. Although nand_do_write_ops intends to allow such mode, it fails do do so Probably this was never tested. Also add missing checks for attempts to write at illegal offsets. Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Maxim Levitsky 提交于
MTD_OOB_PLACE is supposed to read/write the raw oob data similiar to the MTD_OOB_RAW however due to a bug, currently it is not possible to read more data that is specified by the oob 'free' regions. Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Maxim Levitsky 提交于
Since all userspace threads are frozen at the time the nand_suspend is called, they aren't inside any nand function. We don't call try_to_freeze in nand ether. Thus the only user that can be inside the nand functions is an non freezeable kernel thread. Thus we can safely wait for it to finish. Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 26 2月, 2010 2 次提交
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由 Vimal Singh 提交于
Add nand lock / unlock routines. At least 'micron' parts support this. Signed-off-by: NVimal Singh <vimalsingh@ti.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Vimal Singh 提交于
... verification for 'nand_erase_nand' These checks are expected to be used by 'nand_lock' and 'nand_unlock' routines too. As all these three are block aligned operations. So, creating a helper function for this makes sense. Signed-off-by: NVimal Singh <vimalsingh@ti.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 30 11月, 2009 3 次提交
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由 Li Yang 提交于
Symptom: device_suspend(): mtd_cls_suspend+0x0/0x58 returns -11 PM: Device mtd14 failed to suspend: error -11 PM: Some devices failed to suspend This patch enables other chips to be suspended if the active chip of the controller has been suspended. Signed-off-by: NJin Qing <b24347@freescale.com> Signed-off-by: NLi Yang <leoli@freescale.com> Signed-off-by: NAndrew Morton <akpm@linux-foundation.org> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Ben Dooks 提交于
Add NAND_SCAN_SILENT_NODEV to chip->options to the user-worrying messages 'No NAND device found!!!'. This message often worries users (was three exclamation marks really necessary?) and especially in systems such as the Simtec Osiris where there may be optional NAND devices which are not known until probe time. Revised version of the original NAND_PROBE_SPECULATIVE patch after comments by Artem Bityutskiy about adding a whole new call. Signed-off-by: NBen Dooks <ben@simtec.co.uk> Signed-off-by: NSimtec Linux Team <linux@simtec.co.uk> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Simon Kagstrom 提交于
This is a quick and dirty patch to add panic_write for NAND flashes. The patch seems to work OK on my CRIS board running a 2.6.26 kernel with a ID: 0x20, Chip ID: 0xf1 (ST Micro NAND 128MiB 3,3V 8-bit), and also on a OpenRD base (Marvell Kirkwood) board with a Toshiba NAND 512MiB 3,3V 8-bit flash with 2.6.32-pre1. Signed-off-by: NEdgar E. Iglesias <edgar@axis.com> Signed-off-by: NSimon Kagstrom <simon.kagstrom@netinsight.net> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 24 9月, 2009 1 次提交
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由 Jaswinder Singh Rajput 提交于
Fixed following htmldocs warnings: DOCPROC Documentation/DocBook/mtdnand.xml Warning(drivers/mtd/nand/nand_base.c:769): No description found for parameter 'page' Warning(drivers/mtd/nand/nand_base.c:785): No description found for parameter 'page' Warning(drivers/mtd/nand/nand_base.c:824): No description found for parameter 'page' Warning(drivers/mtd/nand/nand_base.c:947): No description found for parameter 'page' Warning(drivers/mtd/nand/nand_base.c:996): No description found for parameter 'page' Warning(drivers/mtd/nand/nand_base.c:1040): No description found for parameter 'page' Signed-off-by: NJaswinder Singh Rajput <jaswinderrajput@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 20 9月, 2009 2 次提交
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由 Sneha Narnakaje 提交于
This patch adds the new mode NAND_ECC_HW_OOB_FIRST in the nand code to support 4-bit ECC on TI DaVinci devices with large page (up to 2KiB) NAND chips. This ECC mode is similar to NAND_ECC_HW, with the exception of read_page API that first reads the OOB area, reads the data in chunks, feeds the ECC from OOB area to the ECC hw engine and perform any correction on the data as per the ECC status reported by the engine. "ECC_HW_OOB_FIRST" name suggested by Thomas Gleixner Reviewed-by: NDavid Brownell <dbrownell@users.sourceforge.net> Signed-off-by: NSneha Narnakaje <nsnehaprabha@ti.com> Signed-off-by: NSandeep Paulraj <s-paulraj@ti.com> Cc: Thomas Gleixner <tglx@linutronix.de> Signed-off-by: NAndrew Morton <akpm@linux-foundation.org> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Sneha Narnakaje 提交于
This patch adds a new "page" parameter to all NAND read_page/read_page_raw APIs. The read_page API for the new mode ECC_HW_OOB_FIRST requires the page information to send the READOOB command and read the OOB area before the data area. Reviewed-by: NDavid Brownell <dbrownell@users.sourceforge.net> Signed-off-by: NSneha Narnakaje <nsnehaprabha@ti.com> Signed-off-by: NSandeep Paulraj <s-paulraj@ti.com> Cc: Thomas Gleixner <tglx@linutronix.de> Signed-off-by: NAndrew Morton <akpm@linux-foundation.org> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 04 9月, 2009 3 次提交
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由 Singh, Vimal 提交于
This patch allows core driver to choose ECC block size in sw ecc case. Signed-off-by: NVimal Singh <vimalsingh@ti.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 vimal singh 提交于
Correcting debug prints by removing function names from print messages and using '__func__' macro instead. Function names were wrong in few places. Signed-off-by: NVimal Singh <vimalsingh@ti.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 vimal singh 提交于
Singed-off-by: NVimal Singh <vimalsingh@ti.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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