- 26 10月, 2010 1 次提交
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由 Guillaume LECERF 提交于
Some old SST chips use 0x50 as sector erase command, instead of 0x30. Make this value variable to handle such chips. Signed-off-by: NGuillaume LECERF <glecerf@gmail.com> Acked-by: NWolfram Sang <w.sang@pengutronix.de> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 25 10月, 2010 13 次提交
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Remove tabs between type and name. Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- *var instead of * var - proper multiline comment - func(args) instead of func (args) - 80 lines So from |total: 2 errors, 37 warnings, 654 lines checked we got to one warning. Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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it will create an empty BBT table without considering vendor's BBT information. Vendor's information may be unavailable if the NAND controller has a different DATA & OOB layout or this information may be allready purged. Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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The first (sixt) byte in the OOB area contains vendor's bad block information. During identification of the NAND chip this information is collected by scanning the complete chip. The option NAND_USE_FLASH_BBT is used to store this information in a sector so we don't have to scan the complete flash. Unfortunately the code stores a marker in order to recognize the BBT in the OOB area. This will fail if the OOB area is completely used for ECC. This patch introduces the option NAND_USE_FLASH_BBT_NO_OOB which has to be used with NAND_USE_FLASH_BBT. It will then store BBT on flash without touching the OOB area. The BBT format on flash remains same except the first page starts with the recognition pattern followed by the version byte. This change was tested in nandsim and it looks good so far :) Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Huang Shijie 提交于
Not all the NAND devices have all the information in additional id bytes. So add a hook in the nand_chip{} is a good method to calculate the right value of oobsize, erasesize and so on. Without the hook,you will get the wrong value, and you have to hack in the ->scan_bbt() to change the wrong value which make the code mess. Signed-off-by: NHuang Shijie <shijie8@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Roman Tereshonkov 提交于
mtd_is_master, mtd_add_partition and mtd_del_partition functions are added to give the possibility of partition manipulation by ioctl request. The old partition add function is modified to fit the dynamic allocation. Signed-off-by: NRoman Tereshonkov <roman.tereshonkov@nokia.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Linus Walleij 提交于
This is the same driver submitted by ST Micros SPEAr team but generalized and tested on the ST-Ericsson U300. It probably easily works on the NHK8815 too. Signed-off-by: NVipin Kumar <vipin.kumar@st.com> Signed-off-by: NRajeev Kumar <rajeev-dlh.kumar@st.com> Signed-off-by: NShiraz Hashim <shiraz.hashim@st.com> Signed-off-by: NViresh Kumar <viresh.kumar@st.com> Signed-off-by: NLinus Walleij <linus.walleij@stericsson.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Florian Fainelli 提交于
This patch adds support for reading NAND device ONFI parameters and use the ONFI informations to define its geometry. In case the device supports ONFI, the onfi_version field in struct nand_chip contains the version (BCD) and the onfi_params structure can be used by drivers to set up timings and such. We currently only support ONFI 1.0 parameters. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NMatthieu Castet <matthieu.castet@parrot.com> Signed-off-by: NMaxime Bizon <mbizon@freebox.fr> Signed-off-by: NFlorian Fainelli <ffainelli@freebox.fr> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Florian Fainelli 提交于
This command is used to read the device ONFI parameters page. Signed-off-by: NFlorian Fainelli <ffainelli@freebox.fr> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
An increase in NAND_MAX_OOBSIZE and NAND_MAX_PAGESIZE is necessary in order to support many new chips. Among those: Toshiba TC58TxG4S2FBAxx 8KB page, 576B OOB Micron MT29F64G08CBAAA 8KB page, 448B OOB Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
There were some improvements and additions necessary in the comments explaining of the expansion of nand_ecclayout, the introduction of nand_ecclayout_user, and the deprecation of the ioctl ECCGETLAYOUT. Also, I found a better placement for the macro MTD_MAX_ECCPOS_ENTRIES; next to the definition of MTD_MAX_OOBFREE_ENTRIES in mtd-abi.h. The macro is really only important for the ioctl code (found in drivers/mtd/mtdchar.c) but since there are small edits being made to the user-space header, I figured this is a better location. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
struct nand_ecclayout is too small for many new chips; OOB regions can be as large as 448 bytes and may increase more in the future. Thus, copying that struct to user-space with the ECCGETLAYOUT ioctl is not a good idea; the ioctl would have to be updated every time there's a change to the current largest size. Instead, the old nand_ecclayout is renamed to nand_ecclayout_user and a new struct nand_ecclayout is created that can accomodate larger sizes and expand without affecting the user-space. struct nand_ecclayout can still be used in board drivers without modification -- at least for now. A new function is provided to convert from the new to the old in order to allow the deprecated ioctl to continue to work with truncated data. Perhaps the ioctl, the conversion process, and the struct nand_ecclayout_user can be removed altogether in the future. Note: There are comments in nand/davinci_nand.c::nand_davinci_probe() regarding this issue; this driver (and maybe others) can be updated to account for extra space. All kernel drivers can use the expanded nand_ecclayout as a drop-in replacement and ignore its benefits. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
Replaced some spaces with tabs to fit CodingStyle guidelines Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 09 8月, 2010 2 次提交
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由 David Woodhouse 提交于
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 David Woodhouse 提交于
Signed-off-by: NDavid Woodhouse <dwmw2@infradead.org>
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- 08 8月, 2010 1 次提交
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由 Barry Song 提交于
There are three reasons to add this support: 1. users probably know the interface type of their flashs, then probe can be faster if they give the right type in platform data since wrong types will not be detected. 2. sometimes, detecting can cause destory to system. For example, for kernel XIP, detecting can cause NOR enter a mode instructions can not be fetched right, which will make kernel crash. 3. For a new probe which is not listed in the rom_probe_types, if users assign it in board files, physmap can still probe it. Signed-off-by: NBarry Song <21cnbao@gmail.com> Signed-off-by: NMike Frysinger <vapier.adi@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 06 8月, 2010 1 次提交
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由 Stefani Seibold 提交于
This patch prevent to schedule while atomic by changing the flchip_shared spinlock into a mutex. This should be save since no atomic path will use this lock. It was suggested by Arnd Bergmann and Vasiliy Kulikov. Signed-off-by: NStefani Seibold <stefani@seibold.net> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 04 8月, 2010 1 次提交
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由 Kyungmin Park 提交于
Samsung SoCs use the own OneNAND controler and detect OneNAND chip at power on. To use this feature, introduce the chip_probe function. Also remove workaround for Samsung SoCs. Signed-off-by: NKyungmin Park <kyungmin.park@samsung.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 02 8月, 2010 3 次提交
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由 Brian Norris 提交于
This is a revision to PATCH 2/2 that I sent. Link: http://lists.infradead.org/pipermail/linux-mtd/2010-July/030911.html Added new flag for scanning of both bytes 1 and 6 of the OOB for a BB marker (instead of simply one or the other). The "check_pattern" and "check_short_pattern" functions were updated to include support for scanning the two different locations in the OOB. In order to handle increases in variety of necessary scanning patterns, I implemented dynamic memory allocation of nand_bbt_descr structs in new function 'nand_create_default_bbt_descr()'. This replaces some increasingly-unwieldy, statically-declared descriptors. It can replace several more (e.g. "flashbased" structs). However, I do not test the flashbased options personally. How this was tested: I referenced 30+ data sheets (covering 100+ parts), and I tested a selection of 10 different chips to varying degrees. Particularly, I tested the creation of bad-block descriptors and basic BB scanning on three parts: ST NAND04GW3B2D, 2K page ST NAND128W3A, 512B page Samsung K9F1G08U0A, 2K page To test these, I wrote some fake bad block markers to the flash (in OOB bytes 1, 6, and elsewhere) to see if the scanning routine would detect them properly. However, this method was somewhat limited because the driver I am using has some bugs in its OOB write functionality. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
NAND_BB_LAST_PAGE used to be in nand.h, but it pertained to bad block management and so belongs next to NAND_BBT_SCAN2NDPAGE in bbm.h. Also, its previous flag value (0x00000400) conflicted with NAND_BBT_SCANALLPAGES so I changed its value to 0x00008000. All uses of the name were modified to provide consistency with other "NAND_BBT_*" flags. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Richard Cochran 提交于
This patchs adds a way for user space programs to find out whether a flash sector is locked. An optional driver method in the mtd_info struct provides the information. Signed-off-by: NRichard Cochran <richard.cochran@omicron.at> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 14 5月, 2010 9 次提交
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由 Kevin Cernekee 提交于
This is a slightly modified version of a patch submitted last year by Reuben Dowle <reuben.dowle@navico.com>. His original comments follow: This patch adds support for some MLC NAND flashes that place the BB marker in the LAST page of the bad block rather than the FIRST page used for SLC NAND and other types of MLC nand. Lifted from Samsung datasheet for K9LG8G08U0A (1Gbyte MLC NAND): " Identifying Initial Invalid Block(s) All device locations are erased(FFh) except locations where the initial invalid block(s) information is written prior to shipping. The initial invalid block(s) status is defined by the 1st byte in the spare area. Samsung makes sure that the last page of every initial invalid block has non-FFh data at the column address of 2,048. ... " As far as I can tell, this is the same for all Samsung MLC nand, and in fact the samsung bsp for the processor used in our project (s3c6410) actually contained a hack similar to this patch but less portable to enable use of their NAND parts. I discovered this problem when trying to use a Micron NAND which does not used this layout - I wish samsung would put their stuff in main-line to avoid this type of problem. Currently this patch causes all MLC nand with manufacturer codes from Samsung and ST(Numonyx) to use this alternative location, since these are the manufactures that I know of that use this layout. Signed-off-by: NKevin Cernekee <cernekee@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Kevin Cernekee 提交于
Some of the newer MLC devices have a 6-byte ID sequence in which several field definitions differ from older chips in a manner that is not backward compatible. For instance: Samsung K9GAG08U0M (5-byte sequence): ec d5 14 b6 74 4th byte, bits 1:0 encode the page size: 0=1KiB, 1=2KiB, 2=4KiB, 3=8KiB 4th byte, bits 5:4 encode the block size: 0=64KiB, 1=128KiB, ... 4th byte, bit 6 encodes the OOB size: 0=8B/512B, 1=16B/512B Samsung K9GAG08U0D (6-byte sequence): ec d5 94 29 34 41 4th byte, bits 1:0 encode the page size: 0=2KiB, 1=4KiB, 3=8KiB, 4=rsvd 4th byte, bits 7;5:4 encode the block size: 0=128KiB, 1=256KiB, ... 4th byte, bits 6;3:2 encode the OOB size: 1=128B/page, 2=218B/page This patch uses the new 6-byte scheme if the following conditions are all true: 1) The ID code wraps around after exactly 6 bytes 2) Manufacturer is Samsung 3) 6th byte is zero The patch also extends the maximum OOB size from 128B to 256B. Signed-off-by: NKevin Cernekee <cernekee@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Kevin Cernekee 提交于
With gcc 4.4.3 -O2 on MIPS32: drivers/mtd/chips/cfi_util.c: In function 'cfi_qry_present': include/linux/mtd/map.h:390: warning: 'r' may be used uninitialized in this function include/linux/mtd/map.h:375: note: 'r' was declared here include/linux/mtd/map.h:390: warning: 'r' may be used uninitialized in this function include/linux/mtd/map.h:375: note: 'r' was declared here Signed-off-by: NKevin Cernekee <cernekee@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Kevin Cernekee 提交于
Signed-off-by: NKevin Cernekee <cernekee@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Kyungmin Park 提交于
This patch adds a new callback for the underlying drivers, which is called instead of accessing the buffer ram directly. This callback will be used by Samsung OneNAND driver to implement DMA transfers on S5PC110 SoC. Signed-off-by: NKyungmin Park <kyungmin.park@samsung.com> Signed-off-by: NMarek Szyprowski <m.szyprowski@samsung.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Kyungmin Park 提交于
This patch extends OneNAND core code with support for OneNAND verify write check. This is done by allocating the buffer for verify read directly from the core code. Signed-off-by: NKyungmin Park <kyungmin.park@samsung.com> Signed-off-by: NMarek Szyprowski <m.szyprowski@samsung.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Kyungmin Park 提交于
This patch adds support for OneNAND chips that have 4KiB page size. Signed-off-by: NKyungmin Park <kyungmin.park@samsung.com> Signed-off-by: NMarek Szyprowski <m.szyprowski@samsung.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Wolfram Sang 提交于
Factor out old manufacturers and use the generic ones from cfi.h Signed-off-by: NWolfram Sang <w.sang@pengutronix.de> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Guillaume LECERF 提交于
SST 39VF160x and 39VF320x chips use vendorname id 0x0701 and alternative unlock addresses. Add support for them in cfi_probe.c. Signed-off-by: NGuillaume LECERF <glecerf@gmail.com> Reviewed-by: NWolfram Sang <w.sang@pengutronix.de> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 13 5月, 2010 1 次提交
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由 Peter Huewe 提交于
This patch fixes a build failure[1] by simply moving the function mtd_to_flctl beneath the definition of sh_flctl which it uses. BF introduced by patch 'mtd/nand/sh_flctl: Replace the dangerous mtd_to_flctl macro' (67026418) Signed-off-by: NPeter Huewe <peterhuewe@gmx.de> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 10 5月, 2010 3 次提交
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由 Stefani Seibold 提交于
The use of a memcpy() during a spinlock operation will cause very long thread context switch delays if the flash chip bandwidth is low and the data to be copied large, because a spinlock will disable preemption. For example: A flash with 6,5 MB/s bandwidth will cause under ubifs, which request sometimes 128 KiB (the flash erase size), a preemption delay of 20 milliseconds. High priority threads will not be served during this time, regardless whether this threads access the flash or not. This behavior breaks real time. The patch changes all the use of spin_lock operations for xxxx->mutex into mutex operations, which is exact what the name says and means. I have checked the code of the drivers and there is no use of atomic pathes like interrupt or timers. The mtdoops facility will also not be used by this drivers. So it is dave to replace the spin_lock against mutex. There is no performance regression since the mutex is normally not acquired. Changelog: 06.03.2010 First release 26.03.2010 Fix mutex[1] issue and tested it for compile failure Signed-off-by: NStefani Seibold <stefani@seibold.net> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Ferenc Wagner 提交于
The original macro worked only when applied to variables named 'mtd'. While this could have been fixed by simply renaming the macro argument, a more type-safe replacement is preferred. Signed-off-by: NFerenc Wagner <wferi@niif.hu> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Andrea Gelmini 提交于
include/linux/mtd/mtdram.h:6: ERROR: code indent should use tabs where possible Signed-off-by: NAndrea Gelmini <andrea.gelmini@gelma.net> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 27 2月, 2010 5 次提交
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由 Maxim Levitsky 提交于
Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 David Woodhouse 提交于
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Maxim Levitsky 提交于
This can be used to protect against bitflips in that field, but now mostly for smartmedia. Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Maxim Levitsky 提交于
This changes the behavier of MTD_OOB_RAW. It used to read both OOB and data to the data buffer, however you would still need to specify the dummy oob buffer. This is only used in one place, but makes it hard to read data+oob without ECC test, thus I removed that behavier, and fixed the user. Now MTD_OOB_RAW behaves just like MTD_OOB_PLACE, but doesn't do ECC validation Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Maxim Levitsky 提交于
This patch adds an ability to export sysfs attributes below the block disk device. This can be used to pass the udev an information about the FTL and could include the vendor, serial, version, etc... Signed-off-by: NMaxim Levitsky <maximlevitsky@gmail.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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