Check whether index is within bounds before testing the element.
Signed-off-by: NRoel Kluin <roel.kluin@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

Fix this sparse warnings:
  drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer
  drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer
Signed-off-by: NHannes Eder <hannes@hanneseder.net>
Acked-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: NJiri Kosina <jkosina@suse.cz>

Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

Add MTD tests to Kconfig and Makefiles.
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This test is designed to work for very long time and it tries to
wear few eraseblocks.
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This tests makes sure sub-pages on NAND MTD device work fine.
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This test just performs random operations on random eraseblocks.
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This test examines I/O speed of the flash device.
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

A simple tests which reads whole MTD device one page at a time.
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This test checks that NAND pages read/write work fine.
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>

This test checks that OOB of a NAND MTD device works fine.
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>