media: i2c: ov772x: Add test pattern control
Add support for test pattern control supported by the sensor. Signed-off-by: NLad Prabhakar <prabhakar.mahadev-lad.rj@bp.renesas.com> Reviewed-by: NBiju Das <biju.das.jz@bp.renesas.com> Reviewed-by: NJacopo Mondi <jacopo@jmondi.org> Signed-off-by: NSakari Ailus <sakari.ailus@linux.intel.com> Signed-off-by: NMauro Carvalho Chehab <mchehab+huawei@kernel.org>
Showing
想要评论请 注册 或 登录