mtd: nand: do not scan bad blocks with NAND_BBT_NO_OOB set
Updates to our default function for creating bad block patterns have broken the "no OOB" feature. The NAND_BBT_NO_OOB option should not be set while scanning for bad blocks, but we've been passing all BBT options from nand_chip.bbt_options to the bad block scan. This causes us to hit the: BUG_ON(bd->options & NAND_BBT_NO_OOB); in create_bbt() when we scan the flash for bad blocks. Thus, while it can be legal to set NAND_BBT_NO_OOB in a custom badblock pattern descriptor (presumably with NAND_BBT_CREATE disabled?), we should not pass it through in our default function. Also, to help clarify and emphasize that the function creates bad block patterns only (not, for example, table descriptors for locating flash-based BBT), I renamed `nand_create_default_bbt_descr' to `nand_create_badblock_pattern'. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@intel.com>
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