- 07 11月, 2013 1 次提交
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由 Brian Norris 提交于
Now that the last user of NAND_BBT_SCANALLPAGES has been removed, let's kill this peculiar BBT feature flag. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Reviewed-by: NEzequiel Garcia <ezequiel.garcia@free-electrons.com> Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@linux.intel.com>
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- 30 8月, 2013 1 次提交
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由 Brian Norris 提交于
NAND_BBT_SCANEMPTY is a strange, badly-supported option with omap as its single remaining user. NAND_BBT_SCANEMPTY was likely used by accident in omap2[1]. And anyway, omap2 doesn't scan the chip for bad blocks (courtesy of NAND_SKIP_BBTSCAN), and so its use of this option is irrelevant. This patch drops the NAND_BBT_SCANEMPTY option. [1] http://lists.infradead.org/pipermail/linux-mtd/2012-July/042902.htmlSigned-off-by: NBrian Norris <computersforpeace@gmail.com> Cc: Ivan Djelic <ivan.djelic@parrot.com> Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 07 7月, 2012 2 次提交
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由 Shmulik Ladkani 提交于
Amend the comment to reflect the fact NAND_BBT_NO_OOB refers to the location of the bad block table marker. Signed-off-by: NShmulik Ladkani <shmulik.ladkani@gmail.com> Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
This option was never used and isn't currently used. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 27 3月, 2012 1 次提交
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由 Brian Norris 提交于
Currently, the flash-based BBT implementation writes bad block data only to its flash-based table and not to the OOB marker area. Then, as new bad blocks are marked over time, the OOB markers become incomplete and the flash-based table becomes the only source of current bad block information. This becomes an obvious problem when, for example: * bootloader cannot read the flash-based BBT format * BBT is corrupted and the flash must be rescanned for bad blocks; we want to remember bad blocks that were marked from Linux So to keep the bad block markers in sync with the flash-based BBT, this patch changes the default so that we write bad block markers to the proper OOB area on each block in addition to flash-based BBT. Comments are updated, expanded, and/or relocated as necessary. The new flash-based BBT procedure for marking bad blocks: (1) erase the affected block, to allow OOB marker to be written cleanly (2) update in-memory BBT (3) write bad block marker to OOB area of affected block (4) update flash-based BBT Note that we retain the first error encountered in (3) or (4), finish the procedures, and dump the error in the end. This should handle power cuts gracefully enough. (1) and (2) are mostly harmless (note that (1) will not erase an already-recognized bad block). The OOB and BBT may be "out of sync" if we experience power loss bewteen (3) and (4), but we can reasonably expect that on next boot, subsequent I/O operations will discover that the block should be marked bad again, thus re-syncing the OOB and BBT. Note that this is a change from the previous default flash-based BBT behavior. If your system cannot support writing bad block markers to OOB, use the new NAND_BBT_NO_OOB_BBM option (in combination with NAND_BBT_USE_FLASH and NAND_BBT_NO_OOB). Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <artem.bityutskiy@linux.intel.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 11 9月, 2011 7 次提交
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由 Brian Norris 提交于
In an attempt to improve the documentation of the BBT code, I am expanding the comments I left in commit: 58373ff0 mtd: nand: more BB Detection refactoring and dynamic scan options Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
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由 Brian Norris 提交于
After several steps of rearrangement and consolidation, it is probably worth re-sequencing the numbers on some of our affected flags in nand.h and bbm.h. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
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由 Brian Norris 提交于
According to our new prefix rules, we should rename NAND_CREATE_EMPTY_BBT with a NAND_BBT prefix, i.e., NAND_BBT_CREATE_EMPTY. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
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由 Brian Norris 提交于
The NAND_CREATE_EMPTY_BBT flag was added by commit: 453281a9 mtd: nand: introduce NAND_CREATE_EMPTY_BBT This flag is not used within the kernel and not explained well, so I took the liberty to edit its comments. Also, this is a BBT-related flag (and closely tied with NAND_BBT_CREATE) so I'm moving it to bbm.h next to NAND_BBT_CREATE, thus requiring that we use the flag in nand_chip.bbt_options, *not* in nand_chip.options. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
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由 Brian Norris 提交于
Recall the recently added prefix requirements: * "NAND_" for flags in nand.h, used in nand_chip.options * "NAND_BBT_" for flags in bbm.h, used in nand_chip.bbt_options or in nand_bbt_descr.options Thus, I am changing NAND_USE_FLASH_BBT to NAND_BBT_USE_FLASH. Again, this flag is found in bbm.h and so should NOT be used in the "nand_chip.options" field. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
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由 Brian Norris 提交于
This patch works with the following three flags from two headers (nand.h and bbm.h): (1) NAND_USE_FLASH_BBT (nand.h) (2) NAND_USE_FLASH_BBT_NO_OOB (nand.h) (3) NAND_BBT_NO_OOB (bbm.h) These flags are all related and interdependent, yet they were in different headers. Flag (2) is simply the combination of (1) and (3) and can be eliminated. This patch accomplishes the following: * eliminate NAND_USE_FLASH_BBT_NO_OOB (i.e., flag (2)) * move NAND_USE_FLASH_BBT (i.e., flag (1)) to bbm.h It's important to note that because (1) and (3) are now both found in bbm.h, they should NOT be used in the "nand_chip.options" field. I removed a small section from the mtdnand DocBook because it referes to NAND_USE_FLASH_BBT in nand.h, which has been moved to bbm.h. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
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由 Brian Norris 提交于
This patch reverts most of: commit 58373ff0 mtd: nand: more BB Detection refactoring and dynamic scan options According to the discussion at: http://lists.infradead.org/pipermail/linux-mtd/2011-May/035696.html the NAND_BBT_SCANBYTE1AND6 flag, although technically valid, can break some existing ECC layouts that use the 6th byte in the OOB for ECC data. Furthermore, we apparently do not need to scan both bytes 1 and 6 in the OOB region of the devices under consideration; instead, we only need to scan one or the other. Thus, the NAND_BBT_SCANBYTE1AND6 flag is at best unnecessary and at worst a regression. Signed-off-by: NBrian Norris <computersforpeace@gmail.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com>
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- 25 10月, 2010 2 次提交
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it will create an empty BBT table without considering vendor's BBT information. Vendor's information may be unavailable if the NAND controller has a different DATA & OOB layout or this information may be allready purged. Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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The first (sixt) byte in the OOB area contains vendor's bad block information. During identification of the NAND chip this information is collected by scanning the complete chip. The option NAND_USE_FLASH_BBT is used to store this information in a sector so we don't have to scan the complete flash. Unfortunately the code stores a marker in order to recognize the BBT in the OOB area. This will fail if the OOB area is completely used for ECC. This patch introduces the option NAND_USE_FLASH_BBT_NO_OOB which has to be used with NAND_USE_FLASH_BBT. It will then store BBT on flash without touching the OOB area. The BBT format on flash remains same except the first page starts with the recognition pattern followed by the version byte. This change was tested in nandsim and it looks good so far :) Signed-off-by: NSebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 09 8月, 2010 1 次提交
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由 David Woodhouse 提交于
Signed-off-by: NDavid Woodhouse <dwmw2@infradead.org>
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- 02 8月, 2010 2 次提交
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由 Brian Norris 提交于
This is a revision to PATCH 2/2 that I sent. Link: http://lists.infradead.org/pipermail/linux-mtd/2010-July/030911.html Added new flag for scanning of both bytes 1 and 6 of the OOB for a BB marker (instead of simply one or the other). The "check_pattern" and "check_short_pattern" functions were updated to include support for scanning the two different locations in the OOB. In order to handle increases in variety of necessary scanning patterns, I implemented dynamic memory allocation of nand_bbt_descr structs in new function 'nand_create_default_bbt_descr()'. This replaces some increasingly-unwieldy, statically-declared descriptors. It can replace several more (e.g. "flashbased" structs). However, I do not test the flashbased options personally. How this was tested: I referenced 30+ data sheets (covering 100+ parts), and I tested a selection of 10 different chips to varying degrees. Particularly, I tested the creation of bad-block descriptors and basic BB scanning on three parts: ST NAND04GW3B2D, 2K page ST NAND128W3A, 512B page Samsung K9F1G08U0A, 2K page To test these, I wrote some fake bad block markers to the flash (in OOB bytes 1, 6, and elsewhere) to see if the scanning routine would detect them properly. However, this method was somewhat limited because the driver I am using has some bugs in its OOB write functionality. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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由 Brian Norris 提交于
NAND_BB_LAST_PAGE used to be in nand.h, but it pertained to bad block management and so belongs next to NAND_BBT_SCAN2NDPAGE in bbm.h. Also, its previous flag value (0x00000400) conflicted with NAND_BBT_SCANALLPAGES so I changed its value to 0x00008000. All uses of the name were modified to provide consistency with other "NAND_BBT_*" flags. Signed-off-by: NBrian Norris <norris@broadcom.com> Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@nokia.com> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 25 9月, 2009 1 次提交
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由 Alessandro Rubini 提交于
This consolidates common code in nand.h and bbm.h. The comments and data structures were the same, this keeps the comment from nand.h as it fits 80 columns, while the one in bbm.h did not. Signed-off-by: NAlessandro Rubini <rubini@unipv.it> Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>
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- 07 2月, 2007 1 次提交
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由 Kyungmin Park 提交于
Provide the bad block scan with its own read function so that important error messages that are not from the the bad block scan, can always be printed. Signed-off-by: NAdrian Hunter <ext-adrian.hunter@nokia.com> Signed-off-by: NKyungmin Park <kyungmin.park@samsung.com>
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- 29 6月, 2006 1 次提交
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由 Randy Dunlap 提交于
Fix some kernel-doc typos/spellos. Use kernel-doc syntax in places where it was almost used. Correct/add struct, struct field, and function param names where needed. Signed-off-by: NRandy Dunlap <rdunlap@xenotime.net> Signed-off-by: NDavid Woodhouse <dwmw2@infradead.org>
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- 07 11月, 2005 2 次提交
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由 Thomas Gleixner 提交于
Signed-off-by: NThomas Gleixner <tglx@linutronix.de>
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由 Kyungmin Park 提交于
Simple bad block table source and header files Signed-off-by: NKyungmin Park <kyungmin.park@samsung.com> Signed-off-by: NThomas Gleixner <tglx@linutronix.de>
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