Adds a few simple test cases to ensure that addition, update and removal
of device tree node properties works correctly.
Signed-off-by: NGrant Likely <grant.likely@linaro.org>
Cc: Rob Herring <rob.herring@calxeda.com>
Cc: Benjamin Herrenschmidt <benh@kernel.crashing.org>
Cc: David S. Miller <davem@davemloft.net>
Cc: Nathan Fontenot <nfont@linux.vnet.ibm.com>
Cc: Pantelis Antoniou <panto@antoniou-consulting.com>

Adds a selftest function for the of_match_node function. of_match_node
is supposed to handle precedence for the compatible property as well as
the name and device_type values. This patch adds some test case data and
a function that makes sure each test node matches against the correct
entry of an of_device_id table.

This code was written to verify the new of_match_node() implementation
that is an earlier part of this series.
Signed-off-by: NGrant Likely <grant.likely@linaro.org>
Cc: Kevin Hao <haokexin@gmail.com>

The standard interrupts property in device tree can only handle
interrupts coming from a single interrupt parent. If a device is wired
to multiple interrupt controllers, then it needs to be attached to a
node with an interrupt-map property to demux the interrupt specifiers
which is confusing. It would be a lot easier if there was a form of the
interrupts property that allows for a separate interrupt phandle for
each interrupt specifier.

This patch does exactly that by creating a new interrupts-extended
property which reuses the phandle+arguments pattern used by GPIOs and
other core bindings.
Signed-off-by: NGrant Likely <grant.likely@linaro.org>
Acked-by: NTony Lindgren <tony@atomide.com>
Acked-by: NKumar Gala <galak@codeaurora.org>
[grant.likely: removed versatile platform hunks into separate patch]
Cc: Rob Herring <rob.herring@calxeda.com>

This patch extends the DT selftest code with some test cases for the
interrupt parsing functions.
Signed-off-by: NGrant Likely <grant.likely@secretlab.ca>

This patch creates of_count_phandle_with_args(), a new function for
counting the number of phandle+argument tuples in a given property. This
is better than the existing method of parsing each phandle individually
until parsing fails which is a horribly slow way to do the count.

Tested on ARM using the selftest code.

v3: - Rebased on top of selftest code cleanup patch
v2: - fix bug where of_parse_phandle_with_args() could behave like _count_.
    - made of_gpio_named_count() into a static inline regardless of CONFIG_OF_GPIO
Tested-by: NAndreas Larsson <andreas@gaisler.com>
Signed-off-by: NGrant Likely <grant.likely@secretlab.ca>
Cc: Linus Walleij <linus.walleij@linaro.org>
Cc: Rob Herring <rob.herring@calxeda.com>

Some of the selftests are open-coded. Others use the selftest() macro
defined in drivers/of/selftest.c. The macro makes for cleaner selftest
code, so refactor the of_parse_phandle_with_args() tests to use it.

Cc: Rob Herring <rob.herring@calxeda.com>
Signed-off-by: NGrant Likely <grant.likely@secretlab.ca>

The of_gpio_named_count() self test doesn't hit the out-of-range
condition even though it is coded. Fix the bug by increasing the for
loop range by one.
Reported-by: NAndreas Larsson <andreas@gaisler.com>
Cc: Rob Herring <rob.herring@calxeda.com>
Signed-off-by: NGrant Likely <grant.likely@secretlab.ca>

Add a helper function for finding the index of a string in a string
list property.  This helper is useful for bindings that use a separate
*-name property for attaching names to tuples in another property such
as 'reg' or 'gpios'.
Signed-off-by: NGrant Likely <grant.likely@secretlab.ca>

Add some runtime test cases for the library of device tree parsing functions.

v2: - Add testcase for phandle with 0 args
    - Don't run testcases if testcase data isn't present in device tree
Signed-off-by: NGrant Likely <grant.likely@secretlab.ca>