mtd: nand: scan 1st and 2nd page for Macronix SLC

Signed-off-by: NBrian Norris <computersforpeace@gmail.com>
Signed-off-by: NArtem Bityutskiy <Artem.Bityutskiy@linux.intel.com>
Signed-off-by: NDavid Woodhouse <David.Woodhouse@intel.com>

drivers/mtd/nand/nand_base.c

@@ -3132,8 +3132,8 @@ static struct nand_flash_dev *nand_get_flash_type(struct mtd_info *mtd,
 	 * Bad block marker is stored in the last page of each block
 	 * on Samsung and Hynix MLC devices; stored in first two pages
 	 * of each block on Micron devices with 2KiB pages and on
-	 * SLC Samsung, Hynix, Toshiba and AMD/Spansion. All others scan
-	 * only the first page.
+	 * SLC Samsung, Hynix, Toshiba, AMD/Spansion, and Macronix.
+	 * All others scan only the first page.
 	 */
 	if ((chip->cellinfo & NAND_CI_CELLTYPE_MSK) &&
 			(*maf_id == NAND_MFR_SAMSUNG ||
@@ -3143,7 +3143,8 @@ static struct nand_flash_dev *nand_get_flash_type(struct mtd_info *mtd,
 				(*maf_id == NAND_MFR_SAMSUNG ||
 				 *maf_id == NAND_MFR_HYNIX ||
 				 *maf_id == NAND_MFR_TOSHIBA ||
-				 *maf_id == NAND_MFR_AMD)) ||
+				 *maf_id == NAND_MFR_AMD ||
+				 *maf_id == NAND_MFR_MACRONIX)) ||
 			(mtd->writesize == 2048 &&
 			 *maf_id == NAND_MFR_MICRON))
 		chip->bbt_options |= NAND_BBT_SCAN2NDPAGE;