diff --git a/drivers/thermal/samsung/exynos_tmu.c b/drivers/thermal/samsung/exynos_tmu.c index 1312b34281ffc740306690eca85d58077fe3fd60..32f38b90c4f6a6705b44e8381ee339c2382e47bb 100644 --- a/drivers/thermal/samsung/exynos_tmu.c +++ b/drivers/thermal/samsung/exynos_tmu.c @@ -317,6 +317,9 @@ static void exynos_tmu_control(struct platform_device *pdev, bool on) con = readl(data->base + reg->tmu_ctrl); + if (pdata->test_mux) + con |= (pdata->test_mux << reg->test_mux_addr_shift); + if (pdata->reference_voltage) { con &= ~(reg->buf_vref_sel_mask << reg->buf_vref_sel_shift); con |= pdata->reference_voltage << reg->buf_vref_sel_shift; diff --git a/drivers/thermal/samsung/exynos_tmu.h b/drivers/thermal/samsung/exynos_tmu.h index b42ece4523e8d03387d3ccef722c69d317b92dd1..3fb65547e64c9d9e3d3410f1c0ea729fb5a9332e 100644 --- a/drivers/thermal/samsung/exynos_tmu.h +++ b/drivers/thermal/samsung/exynos_tmu.h @@ -85,6 +85,7 @@ enum soc_type { * @triminfo_reload_shift: shift of triminfo reload enable bit in triminfo_ctrl reg. * @tmu_ctrl: TMU main controller register. + * @test_mux_addr_shift: shift bits of test mux address. * @buf_vref_sel_shift: shift bits of reference voltage in tmu_ctrl register. * @buf_vref_sel_mask: mask bits of reference voltage in tmu_ctrl register. * @therm_trip_mode_shift: shift bits of tripping mode in tmu_ctrl register. @@ -151,6 +152,7 @@ struct exynos_tmu_registers { u32 triminfo_reload_shift; u32 tmu_ctrl; + u32 test_mux_addr_shift; u32 buf_vref_sel_shift; u32 buf_vref_sel_mask; u32 therm_trip_mode_shift; @@ -258,6 +260,7 @@ struct exynos_tmu_registers { * @first_point_trim: temp value of the first point trimming * @second_point_trim: temp value of the second point trimming * @default_temp_offset: default temperature offset in case of no trimming + * @test_mux; information if SoC supports test MUX * @cal_type: calibration type for temperature * @cal_mode: calibration mode for temperature * @freq_clip_table: Table representing frequency reduction percentage. @@ -287,6 +290,7 @@ struct exynos_tmu_platform_data { u8 first_point_trim; u8 second_point_trim; u8 default_temp_offset; + u8 test_mux; enum calibration_type cal_type; enum calibration_mode cal_mode; diff --git a/drivers/thermal/samsung/exynos_tmu_data.c b/drivers/thermal/samsung/exynos_tmu_data.c index d8de5c1fcf84db649d72881f56c5011dc5ea52e2..073c292baa53e12d0bc7c6aef2a8956a81ea4a6d 100644 --- a/drivers/thermal/samsung/exynos_tmu_data.c +++ b/drivers/thermal/samsung/exynos_tmu_data.c @@ -98,6 +98,7 @@ static const struct exynos_tmu_registers exynos4412_tmu_registers = { .triminfo_ctrl = EXYNOS_TMU_TRIMINFO_CON, .triminfo_reload_shift = EXYNOS_TRIMINFO_RELOAD_SHIFT, .tmu_ctrl = EXYNOS_TMU_REG_CONTROL, + .test_mux_addr_shift = EXYNOS4412_MUX_ADDR_SHIFT, .buf_vref_sel_shift = EXYNOS_TMU_REF_VOLTAGE_SHIFT, .buf_vref_sel_mask = EXYNOS_TMU_REF_VOLTAGE_MASK, .therm_trip_mode_shift = EXYNOS_TMU_TRIP_MODE_SHIFT, @@ -174,6 +175,7 @@ struct exynos_tmu_init_data const exynos4412_default_tmu_data = { { EXYNOS4412_TMU_DATA, .type = SOC_ARCH_EXYNOS4412, + .test_mux = EXYNOS4412_MUX_ADDR_VALUE, }, }, .tmu_count = 1, diff --git a/drivers/thermal/samsung/exynos_tmu_data.h b/drivers/thermal/samsung/exynos_tmu_data.h index b130b1e5f52561d7feb60892fd385c9a9b8c8666..a1ea19d9e0a6e6bfee1a80f173dcdf4786dcc284 100644 --- a/drivers/thermal/samsung/exynos_tmu_data.h +++ b/drivers/thermal/samsung/exynos_tmu_data.h @@ -95,6 +95,10 @@ #define EXYNOS_MAX_TRIGGER_PER_REG 4 +/* Exynos4412 specific */ +#define EXYNOS4412_MUX_ADDR_VALUE 6 +#define EXYNOS4412_MUX_ADDR_SHIFT 20 + /*exynos5440 specific registers*/ #define EXYNOS5440_TMU_S0_7_TRIM 0x000 #define EXYNOS5440_TMU_S0_7_CTRL 0x020